Quantitative trait loci for resistance to spot blotch caused by bipolaris sorokiniana in wheat (T. Aestivum L.) lines 'Ning 8201' and 'Chirya 3'
Material type: ArticleLanguage: English Publication details: St. Petersburg (Russia) : Vavilov Research Institute of Plant Industry, 2010.Subject(s): In: International Wheat Conference, 8; Abstracts of oral and poster presentations p. 270Browsing CIMMYT Knowledge Center: John Woolston Library shelves, Collection: CIMMYT Staff Publications Collection Close shelf browser (Hides shelf browser)
Abstract only
Global Wheat Program
Text in English
INT2917
CIMMYT Staff Publications Collection