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Quantitative trait loci for resistance to spot blotch caused by bipolaris sorokiniana in wheat (T. Aestivum L.) lines 'Ning 8201' and 'Chirya 3'

By: Contributor(s): Material type: ArticleArticleLanguage: English Publication details: St. Petersburg (Russia) : Vavilov Research Institute of Plant Industry, 2010.Subject(s): In: International Wheat Conference, 8; Abstracts of oral and poster presentations p. 270
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Global Wheat Program

Text in English

INT2917

CIMMYT Staff Publications Collection

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