Normal view MARC view ISBD view

Quantitative trait loci for resistance to spot blotch caused by bipolaris sorokiniana in wheat (T. Aestivum L.) lines 'Ning 8201' and 'Chirya 3'

Kumar, U.

Quantitative trait loci for resistance to spot blotch caused by bipolaris sorokiniana in wheat (T. Aestivum L.) lines 'Ning 8201' and 'Chirya 3' - St. Petersburg (Russia) : Vavilov Research Institute of Plant Industry, 2010.

Abstract only

Text in English

Subjects--Topical Terms:
Quantitative Trait Loci
Disease resistance
Spots
Bipolaris sorokiniana
Wheat

Place hold
Print
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)

Knowledge Center Catalog

Quantitative trait loci for resistance to spot blotch caused by bipolaris sorokiniana in wheat (T. Aestivum L.) lines 'Ning 8201' and 'Chirya 3'

International Maize and Wheat Improvement Center (CIMMYT) © Copyright 2021.
Carretera México-Veracruz. Km. 45, El Batán, Texcoco, México, C.P. 56237.
If you have any question, please contact us at
CIMMYT-Knowledge-Center@cgiar.org

Knowledge Center Catalog

Quantitative trait loci for resistance to spot blotch caused by bipolaris sorokiniana in wheat (T. Aestivum L.) lines 'Ning 8201' and 'Chirya 3'

International Maize and Wheat Improvement Center (CIMMYT) © Copyright 2021. Carretera México-Veracruz. Km. 45, El Batán, Texcoco, México, C.P. 56237. If you have any question, please contact us at CIMMYT-Knowledge-Center@cgiar.org

International Maize and Wheat Improvement Center (CIMMYT) © Copyright 2021.
Carretera México-Veracruz. Km. 45, El Batán, Texcoco, México, C.P. 56237.
If you have any question, please contact us at
CIMMYT-Knowledge-Center@cgiar.org