000			01827nam a22003617a 4500
001			G73177
003			MX-TxCIM
008			121211s ||||f| 0 p|p||0|| |
020			_a970-648-47-1
022	0		_a1405-7484
040			_aMX-TxCIM
072		0	_aF01
090			_aLook under series title
100	1		_aO'Leary, G.J. _uModeling Extremes of Wheat and Maize Crop Performance in the Tropics; (CIMMYT) El Batan, Mexico; 19-22 Apr 1999 _91779
245	0	0	_aCan contemporary wheat models simulate grain yield accurately in low-potential environments?
260			_aMexico, DF (Mexico) _bCIMMYT : _c2000
340			_aPrinted
490			_aCIMMYT NRG-GIS Series ; _vNo. 00-01
520			_aThe accuracy of eight wheat simulation models was compared for mean simulated yield. The error of prediction generally increased with mean yield. This suggests that, for models designed to simulate yield in low-potential environments, the published errors determined in high-potential environments are not directly applicable for lower yielding environments. Underestimation of wheat yield under stressed conditions was a common problem for many models. Such shortcomings need to be addressed before the models can be expected to exhibit low errors that are commensurate with the low yields. Indeed, new models may need to be derived for accurate simulation at very low yields involving isolated plants
546			_aEnglish
591			_a0010|AGRIS 0101|AL-Wheat Program
593			_aJose Juan Caballero
595			_aCPC
650	1	0	_aEnvironmental factors
650	1	0	_91138 _aGrain _gAGROVOC
650	1	0	_aPlant production _91212
650	1	0	_aSimulation models _92569
653	0		_aCIMMYT
650	1	7	_aTriticum _gAGROVOC _2 _91295
650	1	0	_91313 _aYields _gAGROVOC
700	1		_aWhite, J.W.|Grace, P. _eeds.
942			_cREP
999			_c9937 _d9937