000 02316nab a22003137a 4500
001 68865
003 MX-TxCIM
005 20250725145634.0
008 250530s2009 -us|||p|op||| 00| 0 eng d
022 _a0733-5210
022 _a1095-9963 (Online)
024 8 _ahttps://doi.org/10.1016/j.jcs.2008.09.001
040 _aMX-TxCIM
041 _aeng
100 1 _aLabuschagne, M.
_92259
245 1 4 _aThe influence of temperature extremes on some quality and starch characteristics in bread, biscuit and durum wheat
260 _aUnited States of America :
_bElsevier,
_c2009.
500 _aPeer review
520 _aEnvironmental conditions during grain-fill can affect the duration of protein accumulation and starch deposition, and thus play an important role in grain yield and flour quality of wheat. Two bread-, one durum- and one biscuit wheat were exposed to extreme low (−5.5 °C for 3 h) and high (32 °C/15 °C day/night for three days) temperatures during grain filling under controlled conditions for two consecutive seasons. Flour protein content was increased significantly in one bread wheat, Kariega, under heat stress. Cold stress significantly reduced SDS sedimentation in both bread wheats. Kernel weight and diameter were significantly decreased at both stress treatments for the two bread wheats. Kernel characteristics of the biscuit wheat were thermo stable. Kernel hardness was reduced in the durum wheat for the heat treatment. Durum wheat had consistently low SDS sedimentation values and the bread wheat high values. Across the two seasons, the starch content in one bread wheat was significantly reduced by both high and low temperatures, as is reflected in the reduction of weight and diameter of these kernels. In the durum wheat, only heat caused a significant reduction in starch content, which is again reflected in the reduction of kernel weight and diameter.
546 _aText in English
650 7 _aStarch products
_2AGROVOC
_99651
650 7 _aHeat stress
_2AGROVOC
_91971
650 7 _aWheat
_2AGROVOC
_91310
650 7 _aKernels
_2AGROVOC
_91168
700 1 _aElago, O.
_938984
700 1 _aKoen, E.
_938985
773 0 _dUnited States of America : Elsevier, 2009.
_gv. 49, no. 2, p. 184-189
_tJournal of Cereal Science
_wG444514
_x0733-5210
942 _2ddc
_cJA
_n0
999 _c68865
_d68857