000			02370nam a22003857a 4500
001			G68400
003			MX-TxCIM
005			20211006075507.0
008			121211s ||||f| 0 p|p||0|| |
020			_a970-648-035-8
040			_aMX-TxCIM
072		0	_aF01
072		0	_aH20
082	0	4	_a632.4 _bGIN
100	1		_aWalker, S.L. _uSeptoria and Stagonospora Diseases of Cereals: A Compilation of Global Research. Proceedings of International Workshop, 5. Mexico, D.F. (Mexico); 20-24 Sep 1999
110	2		_aCentro Internacional de Mejoramiento de Maiz y Trigo (CIMMYT), Mexico DF (Mexico)
245	0	0	_aComparison of greenhouse and field levels of resistance to Stagonospora nodorum
260			_aMexico, DF (Mexico) _bCIMMYT : _c1999
340			_aPrinted
520			_aA biparental population of 150 recombinant wheat inbred (RI) lines segregating for reaction to Stagonospora nodorum was developed and tested in the greenhouse and field for levels of resistance. The F 3:4 lines were tested in the greenhouse for incubation period and percent leaf infection 5 and 10 days after initial symptoms of disease. Plants were tested at both the juvenile and adult stages. Adult plants were also tested for percent disease on the spike. The F 3:5 lines were tested in the field over four locations for level of adult leaf and head resistance. Heritability of leaf resistance to S. nodorum was calculated to be 0.56 on an entry means basis and 0.17 on a per plot basis. Heritability of resistance of the spike was calculated to be 0.57 on an entry means basis and 0.20 on a per plot basis. Both heritability estimates are based on field data. Correlations between field data and greenhouse data were generally weak, notably between field data and greenhouse performance of juvenile plants. However, resistance of the spike in the field and the greenhouse were highly correlated (r = 0.74).
546			_aEnglish
591			_a9910|AGRIS 0001
593			_aJose Juan Caballero
595			_aCPC
650	1	7	_aDisease resistance _gAGROVOC _2 _91077
650	1	0	_aGreenhouse effect
650	1	7	_aPlant diseases _gAGROVOC _2 _91206
650	1	0	_aStagonospora
653	0		_aCIMMYT
650	1	7	_aTriticum _gAGROVOC _2 _91295
700	1		_aGinkel, M. van|McNab, A.|Krupinsky, J. _eeds.
700	1		_aLeath, S., _ecoaut.
700	1		_aMurphy, J.P., _ecoaut.
942			_cPRO
999			_c4415 _d4415