| 000 | 03624nab a22004337a 4500 | ||
|---|---|---|---|
| 001 | G90145 | ||
| 003 | MX-TxCIM | ||
| 005 | 20220509203336.0 | ||
| 008 | 210923s2007 gw |||p|op||| 00| 0 eng d | ||
| 022 | _a1432-2242 (Online) | ||
| 022 | _a0040-5752 | ||
| 024 | 8 | _ahttps://doi.org/10.1007/s00122-007-0630-1 | |
| 040 | _aMX-TxCIM | ||
| 041 | _aeng | ||
| 090 | _aCIS-5110 | ||
| 100 | 0 |
_aGuo-Liang Jiang _923035 |
|
| 245 | 1 | 0 | _aQTL analysis of resistance to Fusarium head blight in the novel wheat germplasm CJ 9306. II. Resistance to deoxynivalenol accumulation and grain yield loss |
| 260 |
_aBerlin (Germany) : _bSpringer, _c2007. |
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| 340 | _aComputer File|Printed | ||
| 500 | _aPeer review | ||
| 500 | _aPeer-review: Yes - Open Access: Yes|http://science.thomsonreuters.com/cgi-bin/jrnlst/jlresults.cgi?PC=MASTER&ISSN=0040-5752 | ||
| 520 | _aFusarium head blight (FHB or scab) caused by Fusarium species is a destructive disease in wheat, not only causing dramatic decrease of grain yield and quality, but also leading to serious mycotoxin contamination in the infected grains. This study was conducted to identify and quantify quantitative trait loci (QTLs) contributing to resistance to deoxynivalenol (DON) accumulation as well as to grain yield loss in a population of 152 F7 recombinant inbred lines (RILs) derived from the cross Veery/CJ 9306. DON content in scabby grains and relative decreases of yield components were analyzed. Two new QTLs (QFhs.nau-2DL and QFhs.nau-1AS) for resistance to DON accumulation caused by FHB in wheat were detected, and QTLs QFhs.ndsu-3BS and QFhs.nau-5AS were also validated in CJ 9306, based on a constructed genetic linkage map. On the average of three experiments, major QTLs QFhs.ndsu-3BS and QFhs.nau-2DL explained up to 23 and 20% of phenotypic variation, respectively. QFhs.nau-1AS and QFhs.nau-5AS separately explained 4–6% of phenotypic variation. The differences among years/experiments were significant for all the four QTLs. However, the QTL × environment interaction was significant only for QFhs.nau-2DL, but not for the others. The results suggest that simple sequence repeat (SSR) markers Xgwm533b associated with QFhs.ndsu-3BS, and Xgwm539 associated with QFhs.nau-2DL could be used in marker-assisted selection to enhance resistance to DON accumulation. QFhs.ndsu-3BS + QFhs.nau-2DL and QFhs.nau-2DL + QFhs.nau-5AS would be the optimum choices for two-locus combinations. QFhs.ndsu-3BS was also validated in CJ 9306 for resistance to grain yield loss, explaining 8–15% of phenotypic variation. No QTLs for resistance to DON accumulation or grain yield loss independent of Type II resistance were found. By comparison, however, either of QFhs.nau-2DL or QFhs.nau-5AS alone and their combination were more contributive to resistance to DON accumulation than to Type II resistance. | ||
| 536 | _aGlobal Wheat Program | ||
| 546 | _aText in English | ||
| 591 | _aSpringer | ||
| 594 | _aINT2733 | ||
| 650 | 7 |
_2AGROVOC _92705 _aFusarium |
|
| 650 | 7 |
_2AGROVOC _95348 _aBlight |
|
| 650 | 7 |
_2AGROVOC _91853 _aQuantitative Trait Loci |
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| 650 | 7 |
_2AGROVOC _91077 _aDisease resistance |
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| 650 | 7 |
_2AGROVOC _910042 _aVomitoxin |
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| 650 | 7 |
_2AGROVOC _96242 _aYield losses |
|
| 700 | 1 |
_95682 _aDong, Y. |
|
| 700 | 0 |
_93912 _aJianrong Shi |
|
| 700 | 1 |
_9856 _aWard, R.W. _gGlobal Wheat Program _8INT2733 |
|
| 773 | 0 |
_tTheoretical and Applied Genetics _n634917 _gv. 115, no. 8, p. 1043-1052 _dBerlin (Germany) : Springer, 2007. _wG444762 _x0040-5752 |
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| 856 | 4 |
_yAccess only for CIMMYT Staff _uhttps://hdl.handle.net/20.500.12665/1641 |
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| 942 |
_cJA _2ddc _n0 |
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| 999 |
_c26871 _d26871 |
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