000 00862nab a22003257a 4500
001 G49625
003 MX-TxCIM
008 121211b |||p||p||||||| |z||| |
022 0 _a0099-1112
040 _aMX-TxCIM
041 0 _aEn
043 _aUS
072 0 _aF00
082 0 4 _a81-695778
100 1 _aTucker, C.J.
245 0 0 _aRelationship of spectral data to grain yield variation [within a winter wheat field]
260 _c1980
340 _aPrinted
500 _aill. 25 ref
546 _aEnglish
591 _aCOMOD
595 _aAC
650 1 0 _aPlant production
_91212
650 1 0 _aWheat triticum spp
700 1 _aElgin, J.H. Jr.,
_ecoaut.
700 1 _aHolben, B.N.,
_ecoaut.
700 1 _aMcMurtrey, J.E. III.,
_ecoaut.
773 0 _tPhotogrammetric Engineering and Remote Sensing
_n81-695778
_gv. 46, no. 5, p. 657-666
942 _cJA
999 _c14351
_d14351