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1. Multi‑environment multi‑QTL association mapping identifies disease resistance QTL in barley germplasm from Latin America

by Gutiérrez, L | German, S.E | Pereyra, S.A | Patrick, M.H | Pérez, C.A | Capettini, F | Locatelli, A | Berberian, N.M | Falconi, E.E | Estrada, R | Fros, D | Gonza, V | Altamirano, H | Huerta-Espino, J | Neyra, E | Orjeda, G | Sandoval-Islas, S | Turkington, K | Castro, A.J | Singh, R.P.

Source: Theoretical and Applied GeneticsMaterial type: article Article; Type of continuing resource: periodical Publisher: Berlin (Germany) : Springer-Verlag Heidelberg, 2015Online access: Access only for CIMMYT Staff Availability: Items available for loan: CIMMYT Knowledge Center: John Woolston Library (1).

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2. Genetic analysis and mapping of adult plant resistance loci to leaf rust in durum wheat cultivar Bairds

by Caixia Lan | Basnet, B.R | Singh, R.P | Huerta-Espino, J | Herrera-Foessel, S | Yong Ren | Randhawa, M.S.

Source: Theoretical and Applied GeneticsMaterial type: article Article; Type of continuing resource: periodical Publisher: Berlin, Germany : Springer-Verlag Heidelberg, 2017Online access: Access only for CIMMYT Staff Availability: Items available for loan: CIMMYT Knowledge Center: John Woolston Library (1).

3. Genomic and pedigree-based prediction for leaf, stem, and striperust resistance in wheat [Electronic Resource]

by JULIANA P | Singh, R.P | Singh, P.K | Crossa, J | Huerta-Espino, J | Caixia Lan | Bhavani, S | Rutkoski, J | Poland, J.A | Bergstrom, G.C | Sorrells, M.E.

Source: Theoretical and Applied GeneticsMaterial type: article Article; Type of continuing resource: periodical Publisher: Berlin, Germany : Springer-Verlag Heidelberg, 2017Online access: Open access through Dspace Availability: Items available for loan: CIMMYT Knowledge Center: John Woolston Library (1).

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Centro Internacional de Mejoramiento de Maíz y Trigo (CIMMYT) © Copyright 2015. Carretera México-Veracruz. Km. 45, El Batán, Texcoco, México, C.P. 56237.
Si tiene cualquier pregunta, contáctenos a CIMMYT-Knowledge-Center@cgiar.org