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1. Near infrared reflectance spectroscopy as a new screening tool to increase durum wheat yield

by Ferrio, J.P | Araus, J.L [coaut.] | Bertran, E [coaut.] | Nachit, M.M [coaut.] | Royo, C.|Nachit, M.M.|Di Fonzo, N.|Araus, J.L [eds.] | Royo, C [coaut.].

Material type: book Book Publisher: Zaragoza (Spain) CIHEAM : 2000Collection: CIMMYT Staff Publications CollectionAvailability: Items available for loan: CIMMYT Knowledge Center: John Woolston Library [Call number: CIS-2702] (1).

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2. Estimation of grain yield by near-infrared reflectance spectroscopy in durum wheat

by Ferrio, J.P | Araus, J.L [coaut.] | Bertran, E [coaut.] | Catala, J [coaut.] | Nachit, M.M [coaut.].

Source: EuphyticaMaterial type: article Article Publisher: 2004Online access: Access only for CIMMYT Staff Availability: Items available for loan: CIMMYT Knowledge Center: John Woolston Library [Call number: CIS-4179] (1).

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