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	1.	QTL mapping of stem rust resistance in wheat by Zwart, R Shah, N Bansal, U Sivasamy Murugasamy Singh, D Miah, H Raman, H Martin, P Gupta, V.S Bariana, H.S International Wheat Conference (8th : 1-4 June, 2010 : St. Petersburg, Russia) Material type: Article; Format: print ; Literary form: Not fiction Language: English Publication details: St. Petersburg (Russia) : Vavilov Research Institute of Plant Industry, 2010 In: International Wheat Conference, 8; Abstracts of oral and poster presentations p. 335-336 Availability: Items available for loan: CIMMYT Knowledge Center: John Woolston Library (1)Call number: CIS-5921. Place hold Log in to add tags Add to cart (remove)
	2.	Assessment of genetic variability and strain identification of Xanthomonas oryzae pv. oryzae using RAPD-PCR and IS1112-based PCR by Gupta, V.S Dhaliwal, H.S [coaut.] Gnanamanickam, S.S [coaut.] Rajebhosale, M.D [coaut.] Ranjekar, P.K [coaut.] Sodhi, M [coaut.] Sukhwinder-Singh [coaut.] Material type: Article Language: En Publication details: 2001 In: Current Science v. 80, no. 8, p. 1043-1049 Availability: Items available for loan: CIMMYT Knowledge Center: John Woolston Library (1). Place hold Log in to add tags Add to cart (remove)

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