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	1.	Near infrared reflectance spectroscopy as a new screening tool to increase durum wheat yield by Ferrio, J.P Araus, J.L Bertran, E [coaut.] Nachit, M.M [coaut.] Royo, C.\|Nachit, M.M.\|Di Fonzo, N.\|Araus, J.L [eds.] Royo, C Series: Série A: Séminaires Méditerranéens - Options Méditerranéennes ; No. 40 Material type: Text Publication details: Zaragoza (Spain) CIHEAM : 2000 Availability: Items available for loan: CIMMYT Knowledge Center: John Woolston Library (1)Call number: CIS-2702. Place hold Log in to add tags Add to cart (remove)
	2.	Estimation of grain yield by near-infrared reflectance spectroscopy in durum wheat by Ferrio, J.P Bertran, E Nachit, M Català, J Araus, J.L Material type: Article; Type of continuing resource: periodical Language: English Publication details: Dordrecht (Netherlands) : Springer, 2004 In: Euphytica v. 137, no. 3, p. 373-380630220 Online resources: Access only for CIMMYT Staff Availability: Items available for loan: CIMMYT Knowledge Center: John Woolston Library (1)Call number: CIS-4179. Place hold Log in to add tags Add to cart (remove)

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