TY  - REP
AU  - O'Leary,G.J.
AU  - White,J.W.|Grace,P.
TI  - Can contemporary wheat models simulate grain yield accurately in low-potential environments?
T2  - CIMMYT NRG-GIS Series
SN  - 970-648-47-1
SN  - 1405-7484
PY  - 2000///
CY  - Mexico, DF (Mexico)
PB  - CIMMYT
KW  - Environmental factors
KW  - Grain
KW  - AGROVOC
KW  - Plant production
KW  - Simulation models
KW  - Triticum
KW  - Yields
KW  - CIMMYT
N2  - The accuracy of eight wheat simulation models was compared for mean simulated yield. The error of prediction generally increased with mean yield. This suggests that, for models designed to simulate yield in low-potential environments, the published errors determined in high-potential environments are not directly applicable for lower yielding environments. Underestimation of wheat yield under stressed conditions was a common problem for many models. Such shortcomings need to be addressed before the models can be expected to exhibit low errors that are commensurate with the low yields. Indeed, new models may need to be derived for accurate simulation at very low yields involving isolated plants
ER  -