TY  - CPA
AU  - Kumar,U.
AU  - Joshi,A.K.
AU  - Kumar,S.
AU  - Ramesh Chand
AU  - Roder,M.S.
ED  - International Wheat Conference
TI  - Quantitative trait loci for resistance to spot blotch caused by bipolaris sorokiniana in wheat (T. Aestivum L.) lines 'Ning 8201' and 'Chirya 3'
PY  - 2010///
CY  - St. Petersburg (Russia)
PB  - Vavilov Research Institute of Plant Industry
KW  - AGROVOC
KW  - Quantitative Trait Loci
KW  - Disease resistance
KW  - Spots
KW  - Bipolaris sorokiniana
KW  - Wheat
N1  - Abstract only
T2  - International Wheat Conference, 8; Abstracts of oral and poster presentations
ER  -