Knowledge Center Catalog

Efficiency of double digit evaluation scale of Septoria leaf blotch and its relationship with damage in wheat

By: Contributor(s): Material type: TextTextPublication details: 1996Subject(s): In: International Wheat Conference, 5; Ankara (Turkey); 10-14 Jun 1996; Ankara (Turkey); Ministry of Agriculture and Rural Affairs
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Item type Current library Call number Status Date due Barcode Item holds
Book CIMMYT Knowledge Center: John Woolston Library REFERENCE ONLY (Browse shelf(Opens below)) Available
Total holds: 0

Genetic Resources Program

English

9706|AR96-97E

Jose Juan Caballero

CCJL01


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