Knowledge Center Catalog

Characterization of CIMMYT germplasm for resistance to Septoria diseases of wheat

By: Contributor(s): Material type: TextTextPublication details: Mexico, DF (Mexico) CIMMYT : 2011Description: p. 55ISBN:
  • 978-970-648-180-1
Summary: The leaf spotting disease complex is a major biotic constrain in enhancing grain production in the major wheat growing regions. This complex of diseases include two major Septoria diseases: Septoria tritici blotch incited by the fungus Mycosphaerella graminicola (anamorph: Septoria tritici Rob. ex Desm.) and Stagonospora nodorum blotch caused by Phaeosphaeria nodorum (anamorph: Stagonospora nodorum (Berk.) Castellani & Germano). Both diseases cause serious losses in quality and quantity of grain produced mainly in the high-rainfall areas of wheat production. Epidemics of Septoria tritici blotch and Septoria nodorum blotch of wheat are associated with favorable weather conditions like frequent rains and moderate temperatures, conservation agriculture practices, and wheat monoculture involving cultivation of susceptible cultivars. International Maize and Wheat Improvement Center (CIMMYT), Mexico initiated major efforts to mitigate the threat of Septoria tritici blotch in early 1970s and semi-dwarf wheat germplasm with adequate resistance were developed and distributed globally. Current efforts include screening of wheat germplasm, identification and characterization of new sources of resistance, mapping genes conferring resistance and incorporation of resistance into new, high-yielding backgrounds. Screening trials of elite CIMMYT germplasm from Irrigated, Rainfed and Wide-Crosses Breeding programs reveal high level of resistance to both the Septoria diseases. These germplasm have diverse genetic make-up and the resistance is likely broad based. Genetic and molecular analysis of elite breeding materials is in progress to identify novel resistance genes. Additional efforts are in place to develop superior wheat cultivars with durable Septoria resistance. The International Septoria Nursery (ISEPTON) has been re-established and advanced breeding lines with diverse genetic make-up showing promising agronomic, quality and Septoria resistance are distributed worldwide to be utilized by wheat breeding programs in development of superior wheat cultivars.
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Conference proceedings CIMMYT Knowledge Center: John Woolston Library CIMMYT Staff Publications Collection CIS-6545 (Browse shelf(Opens below)) Available
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Abstract only

The leaf spotting disease complex is a major biotic constrain in enhancing grain production in the major wheat growing regions. This complex of diseases include two major Septoria diseases: Septoria tritici blotch incited by the fungus Mycosphaerella graminicola (anamorph: Septoria tritici Rob. ex Desm.) and Stagonospora nodorum blotch caused by Phaeosphaeria nodorum (anamorph: Stagonospora nodorum (Berk.) Castellani & Germano). Both diseases cause serious losses in quality and quantity of grain produced mainly in the high-rainfall areas of wheat production. Epidemics of Septoria tritici blotch and Septoria nodorum blotch of wheat are associated with favorable weather conditions like frequent rains and moderate temperatures, conservation agriculture practices, and wheat monoculture involving cultivation of susceptible cultivars. International Maize and Wheat Improvement Center (CIMMYT), Mexico initiated major efforts to mitigate the threat of Septoria tritici blotch in early 1970s and semi-dwarf wheat germplasm with adequate resistance were developed and distributed globally. Current efforts include screening of wheat germplasm, identification and characterization of new sources of resistance, mapping genes conferring resistance and incorporation of resistance into new, high-yielding backgrounds. Screening trials of elite CIMMYT germplasm from Irrigated, Rainfed and Wide-Crosses Breeding programs reveal high level of resistance to both the Septoria diseases. These germplasm have diverse genetic make-up and the resistance is likely broad based. Genetic and molecular analysis of elite breeding materials is in progress to identify novel resistance genes. Additional efforts are in place to develop superior wheat cultivars with durable Septoria resistance. The International Septoria Nursery (ISEPTON) has been re-established and advanced breeding lines with diverse genetic make-up showing promising agronomic, quality and Septoria resistance are distributed worldwide to be utilized by wheat breeding programs in development of superior wheat cultivars.

Genetic Resources Program|Research and Partnership Program|Global Wheat Program

English

Lucia Segura

INT2902|INT2868|INT2833|INT1237|INT2692|INT0610|INT3098

CIMMYT Staff Publications Collection


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