Pyramiding slow rusting genes for durable resistance to leaf rust in durum wheat
Material type:
TextPublication details: 2009Description: p. 33Summary: Variants of Puccinia triticina race BBG/BN, separately overcoming three resistance genes, were identified from durum wheat (Triticum turgidum ssp. durum) fields in northwestern Mexico since its introduction in 2001. Major genes available for use in breeding programs are limited and an alternative strategy is required. Previous studies indicated that slow rusting resistance in eight CIMMYT durums was determined by 2 to 3 minor genes with additive effects. Twenty-eight 4-way crosses were made between these lines with the aim of developing new germplasm with enhanced levels of resistance through pyramiding diverse minor genes. Plants in F1 (4-way) through F3 generations were selected for slow rusting under high leaf rust pressure at the Cd. Obregon and El Batan field sites in Mexico and spikes from selected plants were harvested as bulks. Plants in the F4 generation were individually harvested and1,843 advanced lines obtained, among which 106 lines with enhanced resistance, and desirable agronomic and grain characteristics were selected for non-replicated yield and leaf rust evaluation trials at Obregon during the 2007-2008 season. The best 19 lines, exhibiting near-immunity but with the presence of a few susceptible type pustules, parents and susceptible checks were evaluated for leaf rust resistance under very high disease pressure in replicated trials sown on two dates (16 May and 6 June) at El Batan during 2008. Spreader rows of susceptible cultivar ?Banamichi C2004?, sown as border and as hills on one side of each plot, were inoculated with P. triticina race BBG/BP. Leaf rust severities, and host responses to infection were determined from weekly readings, and area under the disease progress curves (AUDPC) were calculated. Several lines were identified with significantly lower final leaf rust severity responses and AUDPC values than the most resistant parent in each cross. Our results show that enhanced levels of slow rusting can be generated by pyramiding diverse genes present in different parents. The trial is being repeated during the 2008-2009 season at Obregon to validate the results. In addition these lines are being used for transferring slow rusting resistance into high yielding, superior quality adapted backgrounds using the single-backcross approach
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|---|---|---|---|---|---|---|---|---|
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Poster Abstract
Variants of Puccinia triticina race BBG/BN, separately overcoming three resistance genes, were identified from durum wheat (Triticum turgidum ssp. durum) fields in northwestern Mexico since its introduction in 2001. Major genes available for use in breeding programs are limited and an alternative strategy is required. Previous studies indicated that slow rusting resistance in eight CIMMYT durums was determined by 2 to 3 minor genes with additive effects. Twenty-eight 4-way crosses were made between these lines with the aim of developing new germplasm with enhanced levels of resistance through pyramiding diverse minor genes. Plants in F1 (4-way) through F3 generations were selected for slow rusting under high leaf rust pressure at the Cd. Obregon and El Batan field sites in Mexico and spikes from selected plants were harvested as bulks. Plants in the F4 generation were individually harvested and1,843 advanced lines obtained, among which 106 lines with enhanced resistance, and desirable agronomic and grain characteristics were selected for non-replicated yield and leaf rust evaluation trials at Obregon during the 2007-2008 season. The best 19 lines, exhibiting near-immunity but with the presence of a few susceptible type pustules, parents and susceptible checks were evaluated for leaf rust resistance under very high disease pressure in replicated trials sown on two dates (16 May and 6 June) at El Batan during 2008. Spreader rows of susceptible cultivar ?Banamichi C2004?, sown as border and as hills on one side of each plot, were inoculated with P. triticina race BBG/BP. Leaf rust severities, and host responses to infection were determined from weekly readings, and area under the disease progress curves (AUDPC) were calculated. Several lines were identified with significantly lower final leaf rust severity responses and AUDPC values than the most resistant parent in each cross. Our results show that enhanced levels of slow rusting can be generated by pyramiding diverse genes present in different parents. The trial is being repeated during the 2008-2009 season at Obregon to validate the results. In addition these lines are being used for transferring slow rusting resistance into high yielding, superior quality adapted backgrounds using the single-backcross approach
Global Wheat Program
English
Lucia Segura
INT2585|INT2833|INT0610
CIMMYT Staff Publications Collection
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