Knowledge Center Catalog

Local cover image
Local cover image

The adult plant resistance (APR) genes Yr18, Yr29 and Yr46 in spring wheat showed significant effect against important yellow rust races under North-West European field conditions

By: Contributor(s): Material type: ArticleArticleLanguage: English Publication details: Springer Netherlands, 2024. Dordrecht (Netherlands) :ISSN:
  • 0014-2336
  • 1573-5060 (Online)
Subject(s): Online resources: In: Euphytica v. 220, no. 7, art. 107Summary: Yellow rust caused by Puccinia striiformis f. sp. tritici (Pst) is one of the most important wheat diseases. Adult plant resistance (APR) genes have gained the attention of breeders and scientists because they show higher durability compared to major race-specific genes. Here, we determined the effect of the APR genes Yr18, Yr29 and Yr46 in North-West European field conditions against three currently important Pst races. We used three pairs of sibling wheat lines developed at CIMMYT, which consisted of a line with the functional resistance gene and a sibling with its non-functional allele. All APR genes showed significant effects against the Pst races Warrior and Warrior (-), and a race of the highly aggressive strain PstS2. The effects of Yr18 and Yr46 were especially substantial in slowing down disease progress. This effect was apparent in both Denmark, where susceptible controls reached 100 percent disease severity, and in United Kingdom where disease pressure was lower. We further validated field results by quantifying fungal biomass in leaf samples and by micro-phenotyping of samples collected during early disease development. Microscopic image analyses using deep learning allowed us to quantify separately the APR effects on leaf colonization and pustule formation. Our results show that the three APR genes can be used in breeding yellow rust resistant varieties of spring wheat to be grown in North-West European conditions, and that deep learning image analysis can be an effective method to quantify effects of APR on colonisation and pustule formation.
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Collection Call number Status Date due Barcode Item holds
Article CIMMYT Knowledge Center: John Woolston Library CIMMYT Staff Publications Collection Available
Total holds: 0

Peer review

Open Access

Yellow rust caused by Puccinia striiformis f. sp. tritici (Pst) is one of the most important wheat diseases. Adult plant resistance (APR) genes have gained the attention of breeders and scientists because they show higher durability compared to major race-specific genes. Here, we determined the effect of the APR genes Yr18, Yr29 and Yr46 in North-West European field conditions against three currently important Pst races. We used three pairs of sibling wheat lines developed at CIMMYT, which consisted of a line with the functional resistance gene and a sibling with its non-functional allele. All APR genes showed significant effects against the Pst races Warrior and Warrior (-), and a race of the highly aggressive strain PstS2. The effects of Yr18 and Yr46 were especially substantial in slowing down disease progress. This effect was apparent in both Denmark, where susceptible controls reached 100 percent disease severity, and in United Kingdom where disease pressure was lower. We further validated field results by quantifying fungal biomass in leaf samples and by micro-phenotyping of samples collected during early disease development. Microscopic image analyses using deep learning allowed us to quantify separately the APR effects on leaf colonization and pustule formation. Our results show that the three APR genes can be used in breeding yellow rust resistant varieties of spring wheat to be grown in North-West European conditions, and that deep learning image analysis can be an effective method to quantify effects of APR on colonisation and pustule formation.

Text in English

Huerta-Espino, J. : No CIMMYT Affiliation

Click on an image to view it in the image viewer

Local cover image

International Maize and Wheat Improvement Center (CIMMYT) © Copyright 2021.
Carretera México-Veracruz. Km. 45, El Batán, Texcoco, México, C.P. 56237.
If you have any question, please contact us at
CIMMYT-Knowledge-Center@cgiar.org