Knowledge Center Catalog

Local cover image
Local cover image

Association of Lr 34 gene complex with spot blotch disease resistance at molecular level in wheat (Triticum aestivum L.)

By: Contributor(s): Material type: ArticleArticleLanguage: English Publication details: New Delhi, Ind. : Indian Society of Genetics and Plant Breeding, 2018.Subject(s): In: Indian Journal of Genetics and Plant Breeding v. 78, no. 3, p. 302-308Summary: Leaf rust and spot blotch are among most important wheat diseases causing substantial yield losses in several parts of the world. The studies at phenotypic level suggested that, leaf tip necrosis (LTN) not only associated with multi fungal resistance gene Lr34 but also confer spot blotch resistance. This LTN ? spot blotch association has not been tested at molecular level and hardly validated in different genetic backgrounds. A total of 87 near isogenic lines (NILs) segregating for Lr34 gene were evaluated for spot blotch resistance and genotyped with the molecular markers linked to QTL QSb.bhu-7D. A set of 147 advanced breeding lines was also evaluated for spot blotch besides being genotyped with markers belonging to Lr34 genic region. Out of 14 markers located on chromosome 7D, four markers segregated in NILs. The genotypic and phenotypic results indicated that the markers reportedly linked with spot blotch differentiate Lr34+ and Lr34-lines and vice versa. This supports the hypothesis that Lr34, Yr18 and QSb.bhu-7D lies in the same gene region. Hence, the linked markers may be used to select both for Lr34 and spot blotch resistant lines.
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Collection Call number Status Date due Barcode Item holds
Article CIMMYT Knowledge Center: John Woolston Library CIMMYT Staff Publications Collection Available
Total holds: 0

Peer review

Leaf rust and spot blotch are among most important wheat diseases causing substantial yield losses in several parts of the world. The studies at phenotypic level suggested that, leaf tip necrosis (LTN) not only associated with multi fungal resistance gene Lr34 but also confer spot blotch resistance. This LTN ? spot blotch association has not been tested at molecular level and hardly validated in different genetic backgrounds. A total of 87 near isogenic lines (NILs) segregating for Lr34 gene were evaluated for spot blotch resistance and genotyped with the molecular markers linked to QTL QSb.bhu-7D. A set of 147 advanced breeding lines was also evaluated for spot blotch besides being genotyped with markers belonging to Lr34 genic region. Out of 14 markers located on chromosome 7D, four markers segregated in NILs. The genotypic and phenotypic results indicated that the markers reportedly linked with spot blotch differentiate Lr34+ and Lr34-lines and vice versa. This supports the hypothesis that Lr34, Yr18 and QSb.bhu-7D lies in the same gene region. Hence, the linked markers may be used to select both for Lr34 and spot blotch resistant lines.

Text in English

Suneel Kumar : Not in IRS staff list but CIMMYT Affiliation

Click on an image to view it in the image viewer

Local cover image

International Maize and Wheat Improvement Center (CIMMYT) © Copyright 2021.
Carretera México-Veracruz. Km. 45, El Batán, Texcoco, México, C.P. 56237.
If you have any question, please contact us at
CIMMYT-Knowledge-Center@cgiar.org