Knowledge Center Catalog

Development and application of PCR markers for breeding wheat for BYDV resistance

By: Contributor(s): Material type: TextTextPublication details: Mexico, DF (Mexico) CIMMYT : 2002Description: p. 70-74ISBN:
  • 970-648-095-1
Subject(s): DDC classification:
  • 632.3 HEN
Summary: Several wheat-Thinopyrum intermedium translocation lines with BYDV resistance gene Bdv2, including HW642, YW443, YW243, and Y991029, were developed by using the addition line L1 as the resistance parent. Out of 600 RAPD primers screened, the primers of OPD04 and OPR19 can amplify a specific band for Bdv2 present in resistant materials with Bdv2, but absent in susceptible wheat parents and other addition lines Z1, Z2, and Z6 without Bdv2. The specific band of OPD04-I300for Bdv2 was cloned, analyzed, and sequenced. Based on the sequence, a pair of primers were designed, synthesized and can amplify only one band present in the resistant materials with Bdv2 but nothing in materials without Bdv2. Results indicated that RAPD marker OPD04-I300 was converted a sequence characterized amplified region (SCAR) marker SC-D04 to facilitate detecting materials with Bdv2 in wheat breeding populations. Another SCAR marker SC-W37 converted from gwm37 -450 was developed for Bdv2. After linkage analysis between these PCR markers and Bdv2 among F2 population plants of HW642/ Zhong8601, results indicated that SC-DO4 and SC-W37 co-segregated with Bdv2 and were more reliable and easily scored. Four generations of plants of the crosses and backcrosses among HW642 and synthetic wheat M53 with resistance to powdery mildew, wheat varieties Zhongmai 16 and Wan7107 were identified by SCAR markers. Results indicated that SCAR markers could be used in assisted selection of wheat, and 300 individual plants with resistance to BYDV and powdery mildew were selected from the backcross populations.
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Several wheat-Thinopyrum intermedium translocation lines with BYDV resistance gene Bdv2, including HW642, YW443, YW243, and Y991029, were developed by using the addition line L1 as the resistance parent. Out of 600 RAPD primers screened, the primers of OPD04 and OPR19 can amplify a specific band for Bdv2 present in resistant materials with Bdv2, but absent in susceptible wheat parents and other addition lines Z1, Z2, and Z6 without Bdv2. The specific band of OPD04-I300for Bdv2 was cloned, analyzed, and sequenced. Based on the sequence, a pair of primers were designed, synthesized and can amplify only one band present in the resistant materials with Bdv2 but nothing in materials without Bdv2. Results indicated that RAPD marker OPD04-I300 was converted a sequence characterized amplified region (SCAR) marker SC-D04 to facilitate detecting materials with Bdv2 in wheat breeding populations. Another SCAR marker SC-W37 converted from gwm37 -450 was developed for Bdv2. After linkage analysis between these PCR markers and Bdv2 among F2 population plants of HW642/ Zhong8601, results indicated that SC-DO4 and SC-W37 co-segregated with Bdv2 and were more reliable and easily scored. Four generations of plants of the crosses and backcrosses among HW642 and synthetic wheat M53 with resistance to powdery mildew, wheat varieties Zhongmai 16 and Wan7107 were identified by SCAR markers. Results indicated that SCAR markers could be used in assisted selection of wheat, and 300 individual plants with resistance to BYDV and powdery mildew were selected from the backcross populations.

English

0208|AGRIS 0401|AL-Wheat Program|R02CIMPU

Juan Carlos Mendieta

CIMMYT Publications Collection


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