Evaluating spot blotch resistance traits in wheat and related species
Material type: TextPublication details: Mexico, DF (Mexico) CIMMYT|UCL|BADC : 1998ISBN:- 970-648-001-3
- 633.1194 DUV
Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | Item holds | |
---|---|---|---|---|---|---|---|---|---|
Conference proceedings | CIMMYT Knowledge Center: John Woolston Library | CIMMYT Publications Collection | 633.1194 DUV (Browse shelf(Opens below)) | 1 | Available | 1J624337 |
Spot blotch of wheat, caused by Bipolaris sorokiniana (syn. Helminthosporium sativa), is regarded as an important wheat disease in China due to its high disease frequency in the northwestern, northeastern, and southern regions of the country. Breeding for resistant wheat varieties is considered the most effective method of control. A critical step in breeding wheat for spot blotch resistance is to evaluate resistance traits and their characteristics. Five local spring wheat varieties and 56 species of wheat relatives were selected for resistance using percent diseased area and lesion type methods. After three years of field evaluation, the five local spring wheat varieties were found to be susceptible to spot blotch, whereas the 56 related species showed varying resistance levels, suggesting there is plenty of resistance for spot blotch in each genus of wheat relatives. Drop inoculation for scoring lesion type was, among other things, easy to perform, repeatable, and produced stable disease scores over years and locations. The lesion type method was also more sensitive for reflecting resistance change with growth stage. This method revealed stable resistance traits and high levels of spot blotch resistance in wheat relatives and would be useful in future breeding programs.
English
9806|AGRIS 9802
Jose Juan Caballero
CIMMYT Publications Collection