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Tan spot resistance in tetraploid and hexaploid wheat

By: Ma, H | Centro Internacional de Mejoramiento de Maiz y Trigo (CIMMYT), Mexico DF (Mexico).
Contributor(s): Duveiller, E.|Dubin, H.J.|Reeves, J.|McNab, A [eds.] | Hughes, G.R [coaut.] | Wenguang Cao [coaut.].
Material type: materialTypeLabelBookAnalytics: Show analyticsPublisher: Mexico, DF (Mexico) CIMMYT|UCL|BADC : 1998ISBN: 970-648-001-3.Subject(s): Breeding methods | Disease resistance | Hexaploidy AGROVOC | Molecular genetics | Plant diseases | Spots | Testing | Tetraploidy | CIMMYT | Triticum | Plant breeding AGROVOCDDC classification: 633.1194 Summary: Tan spot is a member of the leaf-spot complex that attacks wheat in Saskatchewan each year and can cause significant yield losses. Tan spot is particularly important on durum wheat (pink smudge phase) and winter wheat. As part of a program to breed for tan spot resistance in wheat, a range of wheat genotypes was evaluated at the two-to-three-leaf stage for reaction to Pyrenophora tritici-repentis in growth room tests. Sources of resistance, some believed to be previously unreported, were identified in both durum and common wheat. Resistance to tan spot has also been transferred from Triticum timopheevii (Pl 290518) into durum wheat cv. Wakooma to produce resistant sib- lines S3-6, S9-10, and S12-1. Preliminary genetic studies of resistant tetraploid and hexaploid wheats indicate that resistance is simply controlled, involving one or two genes. Evidence for linkage of tan spot resistance and resistance to septoria nodorum blotch to red kernel color was found in line S9- 10. More detailed inheritance studies are planned. Attempts to identify RAPD markers to use in marker-assisted selection for tan spot resistance have commenced. Preliminary results indicate that marker UBC521-650 is loosely linked (15% recombination) to tan spot resistance in the cross S9-10/Sceptre.Collection: CIMMYT Publications Collection
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Conference proceedings CIMMYT Knowledge Center: John Woolston Library

Lic. Jose Juan Caballero Flores

 

CIMMYT Publications Collection 633.1194 DUV (Browse shelf) 1 Available 1F624337
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Tan spot is a member of the leaf-spot complex that attacks wheat in Saskatchewan each year and can cause significant yield losses. Tan spot is particularly important on durum wheat (pink smudge phase) and winter wheat. As part of a program to breed for tan spot resistance in wheat, a range of wheat genotypes was evaluated at the two-to-three-leaf stage for reaction to Pyrenophora tritici-repentis in growth room tests. Sources of resistance, some believed to be previously unreported, were identified in both durum and common wheat. Resistance to tan spot has also been transferred from Triticum timopheevii (Pl 290518) into durum wheat cv. Wakooma to produce resistant sib- lines S3-6, S9-10, and S12-1. Preliminary genetic studies of resistant tetraploid and hexaploid wheats indicate that resistance is simply controlled, involving one or two genes. Evidence for linkage of tan spot resistance and resistance to septoria nodorum blotch to red kernel color was found in line S9- 10. More detailed inheritance studies are planned. Attempts to identify RAPD markers to use in marker-assisted selection for tan spot resistance have commenced. Preliminary results indicate that marker UBC521-650 is loosely linked (15% recombination) to tan spot resistance in the cross S9-10/Sceptre.

English

9806|AGRIS 9802

Jose Juan Caballero

CIMMYT Publications Collection

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Centro Internacional de Mejoramiento de Maíz y Trigo (CIMMYT) © Copyright 2015. Carretera México-Veracruz. Km. 45, El Batán, Texcoco, México, C.P. 56237.
Lunes –Viernes 9:00 am. 17:00 pm. Si tiene cualquier pregunta, contáctenos a CIMMYT-Knowledge-Center@cgiar.org