Knowledge Center Catalog

Evaluating spot blotch resistance of wheat: Improving disease assessment under controlled conditions and in the field

By: Contributor(s): Material type: TextTextPublication details: Mexico, DF (Mexico) CIMMYT|UCL|BADC : 1998ISBN:
  • 970-648-001-3
Subject(s): DDC classification:
  • 633.1194 DUV
Summary: Studies were conducted on spot blotch resistance of wheat at these edling stage. Results showed that plants inoculated with Bipolaris sorokiniana, causal agent of spot blotch, should be exposed to conditions of 25ºC and 100% relative humidity (RH)for 24 h and then incubated at 24ºC and 85% RH for 144 h to allow the detection of statistically significant differences in resistance between genotypes. Among the components of resistance studied, lesion density was difficult to assess. Standardization of experimental conditions was critical for the correct appraisal of genetic resistance at the seedling stage and differences between genotypes tended to be obscured as a result of high data variation. In the field, comparison of AUDPC (area under disease progress curve) was the best approach to separate genotypes based on disease scores repeated over time. Differences in spot blotch resistance observed among genotypes in Poza Rica, Mexico, were generally in agreement with data observed elsewhere; however, the relationship between disease severity, yield loss, plant size, and earliness appeared to be complex. Due to high disease pressure, early genotypes such as NL297, harboring some level of spot blotch resistance, appeared susceptible. Studies on spot blotch resistance under climatic conditions more favorable for the wheat crop are needed in order to detect moderate resistance levels and to better assess the effect of disease on yield.
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Collection Call number Copy number Status Date due Barcode Item holds
Conference proceedings CIMMYT Knowledge Center: John Woolston Library CIMMYT Publications Collection 633.1194 DUV (Browse shelf(Opens below)) 1 Available X624337
Total holds: 0

Studies were conducted on spot blotch resistance of wheat at these edling stage. Results showed that plants inoculated with Bipolaris sorokiniana, causal agent of spot blotch, should be exposed to conditions of 25ºC and 100% relative humidity (RH)for 24 h and then incubated at 24ºC and 85% RH for 144 h to allow the detection of statistically significant differences in resistance between genotypes. Among the components of resistance studied, lesion density was difficult to assess. Standardization of experimental conditions was critical for the correct appraisal of genetic resistance at the seedling stage and differences between genotypes tended to be obscured as a result of high data variation. In the field, comparison of AUDPC (area under disease progress curve) was the best approach to separate genotypes based on disease scores repeated over time. Differences in spot blotch resistance observed among genotypes in Poza Rica, Mexico, were generally in agreement with data observed elsewhere; however, the relationship between disease severity, yield loss, plant size, and earliness appeared to be complex. Due to high disease pressure, early genotypes such as NL297, harboring some level of spot blotch resistance, appeared susceptible. Studies on spot blotch resistance under climatic conditions more favorable for the wheat crop are needed in order to detect moderate resistance levels and to better assess the effect of disease on yield.

Genetic Resources Program|Research and Partnership Program

English

9806|AGRIS 9802|anterior|R97-98PROCE|FINAL9798

Jose Juan Caballero

INT1237|CCJL01

CIMMYT Publications Collection


International Maize and Wheat Improvement Center (CIMMYT) © Copyright 2021.
Carretera México-Veracruz. Km. 45, El Batán, Texcoco, México, C.P. 56237.
If you have any question, please contact us at
CIMMYT-Knowledge-Center@cgiar.org