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Identification of QTLs for quantitative resistance to stripe rust (Puccinia striiformis F. sp. tritici) in bread wheat

By: Imtiaz, M.
Contributor(s): Ahmad, M [coaut.] | Cromey, M.G [coaut.] | Hampton, J.G [coaut.] | McNeil, D [coaut.].
Material type: materialTypeLabelArticlePublisher: 2005ISSN: 1812-5425 (Revista en electrónico); 1812-5387.Subject(s): AUDPC | Components of resistance | Marker-assisted selection Quantitative trait loci In: Plant Pathology Journal v. 4, no. 1, p. 8-13Summary: Quantitative resistance to stripe rust in wheat delays disease epidemic development and is often not controlled by race-specific resistance genes. To identify quantitative trait loci (QTLs) affecting quantitative resistance to stripe rust, 140 Doubled Haploid (DH) lines from a cross between adult plant resistant parent Cv. Otane and the susceptible parent Cv. Tiritea were developed. These DH lines were evaluated for Latent Period (LP), Pustule Density (PD) and Pustule Length (PL) at the adult plant stage in the glasshouse to pathotype 106E139A+ of Puccinia striiformis f. sp. tritici and in the field for Area Under the Disease Progress Curve (AUDPC). Two genomic regions on chromosomes 7B and 7D were significantly associated with LP and one QTL (on chromosome 5D) was associated with PD only. A QTL on chromosome 3D was associated with PL. Favourable alleles contributed from Otane chromosomes 3D and 5D were associated with AUDPC in the field. Ten AFLP markers also showed significant association with these measures of resistance. The results suggested that the quantitative resistance of Otane is oligogenic and susceptible Tiritea also carrying QTLs for resistance. QTLs for AUDPC were also associated with the components of resistance LP, PD and PL. Therefore, calculating AUDPC can be an efficient way to estimate the joint effect of components of quantitative resistance.Collection: Reprints Collection
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Article CIMMYT Knowledge Center: John Woolston Library

Lic. Jose Juan Caballero Flores

 

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Peer-review: Yes - Open Access: Yes|http://science.thomsonreuters.com/cgi-bin/jrnlst/jlresults.cgi?PC=MASTER&ISSN=1598-2254

Quantitative resistance to stripe rust in wheat delays disease epidemic development and is often not controlled by race-specific resistance genes. To identify quantitative trait loci (QTLs) affecting quantitative resistance to stripe rust, 140 Doubled Haploid (DH) lines from a cross between adult plant resistant parent Cv. Otane and the susceptible parent Cv. Tiritea were developed. These DH lines were evaluated for Latent Period (LP), Pustule Density (PD) and Pustule Length (PL) at the adult plant stage in the glasshouse to pathotype 106E139A+ of Puccinia striiformis f. sp. tritici and in the field for Area Under the Disease Progress Curve (AUDPC). Two genomic regions on chromosomes 7B and 7D were significantly associated with LP and one QTL (on chromosome 5D) was associated with PD only. A QTL on chromosome 3D was associated with PL. Favourable alleles contributed from Otane chromosomes 3D and 5D were associated with AUDPC in the field. Ten AFLP markers also showed significant association with these measures of resistance. The results suggested that the quantitative resistance of Otane is oligogenic and susceptible Tiritea also carrying QTLs for resistance. QTLs for AUDPC were also associated with the components of resistance LP, PD and PL. Therefore, calculating AUDPC can be an efficient way to estimate the joint effect of components of quantitative resistance.

Global Wheat Program

English

Carelia Juarez

Reprints Collection

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