Normal view MARC view ISBD view

Genomic regions associated with resistance to tan spot of wheat

By: Singh, P.K.
Contributor(s): Herrera-Foessel, S.A [coaut.] | Huerta-Espino, J [coaut.] | Duveiller, E [coaut.] | Singh, R.P [coaut.] | Bhavani, S [coaut.] | Crossa, J [coaut.].
Material type: materialTypeLabelArticlePublisher: 2009Online resources: Access only for CIMMYT Staff In: Phytopathology v. 99, no. 6 Supplement, p. S120Summary: Tan spot, a major foliar disease of wheat, is caused by an ascomycete Pyrenophora tritici-repentis. Linkage disequilibrium can be used to identify genomic regions associated with tan spot resistance. Association analysis utilizing population structure and additive genetic covariance between relatives was conducted on a historical set of 170 bread wheat lines developed at CIMMYT, Mexico with the genetic data generated with 813 DArT and 831 other markers. Tan spot disease reaction data was obtained by screening the 170 wheat lines with P. tritici-repentis race 1 isolate Ptr-1. Three experiments were conducted in the greenhouse with each experiment designed as randomized block design with two replicates. Two-weeks old seedlings were spore-inoculated and rated eight days later for disease reaction based on a 1 to 5 lesion type rating scale. Results reveal that genomic regions on short arm of chromosomes 1A, 1B, and 6B and long arm of chromosomes 4A, 6A, 2B, 3B, 5B, and 7B are associated with resistance to tan spot. Some of the genomic regions contributing to tan spot resistance have been previously identified; however, novel genomic regions on long arm of chromosomes 4A, 6A, and 7B, were identified in this study. Findings of this study reveal that CIMMYT wheat germplasm is likely to contain additional novel sources of resistance to tan spot.
Tags from this library: No tags from this library for this title. Log in to add tags.
    average rating: 0.0 (0 votes)
Item type Current location Collection Call number Status Date due Barcode Item holds
Article CIMMYT Knowledge Center: John Woolston Library

Lic. Jose Juan Caballero Flores

 

CIMMYT Staff Publications Collection CIS-5642 (Browse shelf) Available
Total holds: 0

Abstracts submitted for presentation at the APS 2009 Annual Meeting

Peer-review: Yes - Open Access: Yes|http://science.thomsonreuters.com/cgi-bin/jrnlst/jlresults.cgi?PC=MASTER&ISSN=0031-949X

Tan spot, a major foliar disease of wheat, is caused by an ascomycete Pyrenophora tritici-repentis. Linkage disequilibrium can be used to identify genomic regions associated with tan spot resistance. Association analysis utilizing population structure and additive genetic covariance between relatives was conducted on a historical set of 170 bread wheat lines developed at CIMMYT, Mexico with the genetic data generated with 813 DArT and 831 other markers. Tan spot disease reaction data was obtained by screening the 170 wheat lines with P. tritici-repentis race 1 isolate Ptr-1. Three experiments were conducted in the greenhouse with each experiment designed as randomized block design with two replicates. Two-weeks old seedlings were spore-inoculated and rated eight days later for disease reaction based on a 1 to 5 lesion type rating scale. Results reveal that genomic regions on short arm of chromosomes 1A, 1B, and 6B and long arm of chromosomes 4A, 6A, 2B, 3B, 5B, and 7B are associated with resistance to tan spot. Some of the genomic regions contributing to tan spot resistance have been previously identified; however, novel genomic regions on long arm of chromosomes 4A, 6A, and 7B, were identified in this study. Findings of this study reveal that CIMMYT wheat germplasm is likely to contain additional novel sources of resistance to tan spot.

Genetic Resources Program|Research and Partnership Program|Global Wheat Program

English

INT2843|CCJL01|INT2868|INT2833|INT1237|INT0610

There are no comments for this item.

Log in to your account to post a comment.

Click on an image to view it in the image viewer

baner

International Maize and Wheat Improvement Center (CIMMYT) © Copyright 2015. Carretera México-Veracruz. Km. 45, El Batán, Texcoco, México, C.P. 56237.
Monday –Friday 9:00 am. 17:00 pm. If you have any question, please contact us at CIMMYT-Knowledge-Center@cgiar.org

Centro Internacional de Mejoramiento de Maíz y Trigo (CIMMYT) © Copyright 2015. Carretera México-Veracruz. Km. 45, El Batán, Texcoco, México, C.P. 56237.
Lunes –Viernes 9:00 am. 17:00 pm. Si tiene cualquier pregunta, contáctenos a CIMMYT-Knowledge-Center@cgiar.org