Leaf rust (Puccinia triticina) resistance in wheat (Triticum aestivum) cultivars grown in Northern Europe 1992-2002
Material type: ArticleLanguage: English Publication details: United Kingdom : Wiley, 2006.ISSN:- 1601-5223 (Online)
Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | Item holds | |
---|---|---|---|---|---|---|---|---|---|
Article | CIMMYT Knowledge Center: John Woolston Library | CIMMYT Staff Publications Collection | CIS-4665 (Browse shelf(Opens below)) | 1 | Available | 633953 |
Browsing CIMMYT Knowledge Center: John Woolston Library shelves, Collection: CIMMYT Staff Publications Collection Close shelf browser (Hides shelf browser)
Peer-review: Yes - Open Access: Yes|http://science.thomsonreuters.com/cgi-bin/jrnlst/jlresults.cgi?PC=MASTER&ISSN=0018-0661
Peer review
Open Access
Diversity of resistance to leaf rust caused by Puccinia triticina can be enhanced in wheat (Triticum aestivum) cultivars through a better knowledge of resistance genes that are present in important cultivars and germplasm. Multi‐pathotype tests on 84 wheat cultivars grown in Denmark, Finland, Norway and Sweden during 1992–2002 and 39 differential testers enabled the postulation of nine known genes for seedling resistance to leaf rust. Genes Lr1, Lr2a, Lr3, Lr10, Lr13, Lr14a, Lr17, Lr23 and Lr26 were found singly or in combination in 47 of the cultivars (55.9%). The most frequently occurring genes in cultivars grown in Sweden were Lr13 (20.4%), Lr14a (14.8%) and Lr26 (14.8%). Lr14a was the most common gene in cultivars grown in Norway (18.7%), Lr13 in Denmark (35.5%) and Lr10 in Finland (20.0%). Although 28 cultivars (33.3%) exhibited a response pattern that could not be assigned to resistance genes or combinations present in the tester lines, several pathotypes carried virulence and hence these genes or combinations are of limited use. Nine cultivars (10.7%) lacked detectable seedling resistance. One cultivar was resistant to all pathotypes used in the study.
Global Wheat Program
Text in English
0602
SE-SLU 2007 HYSING D r
INT0610