Mapping Yr28 and other genes for resistance to stripe rust in wheat
Material type: ArticleLanguage: English Publication details: USA : CSSA : Wiley, 2000.ISSN:- 1435-0653 (Online)
Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | Item holds | |
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Article | CIMMYT Knowledge Center: John Woolston Library | CIMMYT Staff Publications Collection | CIS-3320 (Browse shelf(Opens below)) | 1 | Available | 631102 |
Peer review
Peer-review: Yes - Open Access: Yes|http://science.thomsonreuters.com/cgi-bin/jrnlst/jlresults.cgi?PC=MASTER&ISSN=0011-183X
Stripe (yellow) rust, caused by Puccinia striiformis West., is an important constraint to wheat production in cool environments. With the purpose of identifying genes for resistance to the disease, a RFLP mapping population of recombinant inbred lines developed from a synthetic [Triticum turgidum L. × Aegilops tauschii (Coss.) Schmal.] × T. aestivum L. cv. `Opata 85' cross was visually evaluated for seedling infection type in three greenhouse inoculation tests and for adult-plant disease severity in four field tests at Celaya and Toluca, Mexico. A previously unidentified gene from Ae. tauschii, designated as Yr28, was located on chromosome arm 4DS. Although Yr28 strongly influenced seedling resistance, it showed a strong effect in adult plants at only the warmer of the two field sites. A second gene showed high environmental sensitivity in seedling tests, with resistance associated with Opata marker alleles near the adult-plant resistance (APR) gene Yr18 on chromosome arm 7DS. Gene Yr18, known to be present in Opata, strongly reduced disease response in field trials and was tightly linked with leaf-rust resistance gene Lr34 Three other regions from Opata on chromosome arms 3BS, 3DS, and 5DS were also associated with APR.
Global Wheat Program
Text in English
EE|Crop Science Society of America (CSSA)|R99-00JOURN|AL-Wheat Program|R01JOURN
INT0610
CIMMYT Staff Publications Collection