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Relationship of spectral data to grain yield variation [within a winter wheat field]

By: Contributor(s): Material type: ArticleArticleLanguage: En Publication details: 1980ISSN:
  • 0099-1112
Subject(s): DDC classification:
  • 81-695778
In: Photogrammetric Engineering and Remote Sensing v. 46, no. 5, p. 657-66681-695778
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