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Comparison of early generation yield testing and a single seed descent procedure in wheat breeding

By: Contributor(s): Material type: ArticleArticleLanguage: En Publication details: 1975ISSN:
  • 1435-0653 (Revista en electrónico)
Subject(s): DDC classification:
  • 75-044922
In: Crop Science v. 15, no. 3, p. 295-29975-044922
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19 ref.; Summary (En)

Peer-review: Yes - Open Access: Yes|http://science.thomsonreuters.com/cgi-bin/jrnlst/jlresults.cgi?PC=MASTER&ISSN=0011-183X

English

COMOD|Crop Science Society of America (CSSA)

AGRIS Collection


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