Knowledge Center Catalog

Epidemiology and control of bacterial leaf blight of corn (Record no. 61900)

MARC details
000 -LEADER
fixed length control field 02232nab a22003017a 4500
001 - CONTROL NUMBER
control field 61900
003 - CONTROL NUMBER IDENTIFIER
control field MX-TxCIM
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20211006085210.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 180103s1977 xxu|||p|op||| 00| 0 eng d
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number 0031-949X
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number 1943-7684 (Online)
024 8# - OTHER STANDARD IDENTIFIER
Standard number or code https://doi.org/10.1094/Phyto-67-1113
040 ## - CATALOGING SOURCE
Original cataloging agency MX-TxCIM
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
100 1# - MAIN ENTRY--PERSONAL NAME
9 (RLIN) 13215
Personal name Sumner, D.R.
245 10 - TITLE STATEMENT
Title Epidemiology and control of bacterial leaf blight of corn
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc. St. Paul, MN (USA) :
Name of publisher, distributor, etc. American Phytopathological Society,
Date of publication, distribution, etc. 1977.
500 ## - GENERAL NOTE
General note Peer review
520 ## - SUMMARY, ETC.
Summary, etc. Bacterial leaf blight, which is caused by Pseudomonas avenae, was widespread in corn in southern Georgia from 1973 through 1976. The survival of the bacterium was determined by means of a basal salts agar medium containing D-sorbitol and neutral red (SNR agar). The bacterium did not survive in infected leaves on dead plants 2 mo after maturity, but did survive for 2 wk in infected green leaves buried in soil. Pseudomonas avenae was pathogenic to many other cultivars of gramineous species in greenhouse tests, but it was not isolated from plants other than corn in nature. Most cultivars of corn were resistant to the bacterium, but several were highly susceptible. The apparent infection rate (r) in a susceptible cultivar was 0.18 to 0.21 plants/day, compared with 0.13 to 0.16 plants/day in several resistant cultivars, during the 3- to 4-wk period before tasseling. Lesions were relatively small on leaves of resistant plants, and streaking and leaf shredding rarely occurred. The disease did not become epidemic in any of the cultivars after tasseling. The bacterium caused leaf blight but not stalk rot, shank rot, or ear rot. The in vitro dry matter digestibility of blighted plants at tasseling was not different from that of green plants.
546 ## - LANGUAGE NOTE
Language note Text in English
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Maize
Miscellaneous information AGROVOC
Source of heading or term
9 (RLIN) 1173
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
9 (RLIN) 2466
Topical term or geographic name as entry element Ecology
Source of heading or term AGROVOC
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
9 (RLIN) 13216
Topical term or geographic name as entry element Xanthomonas oryzae
Source of heading or term AGROVOC
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
9 (RLIN) 13217
Topical term or geographic name as entry element Pseudomonas avenae
Source of heading or term AGROVOC
700 1# - ADDED ENTRY--PERSONAL NAME
9 (RLIN) 4679
Personal name Schaad, N.W.
773 0# - HOST ITEM ENTRY
Related parts v. 67, p. 1113-1118
Title Phytopathology
International Standard Serial Number 0031-949X
Place, publisher, and date of publication St. Paul, MN (USA) : American Phytopathological Society, 1977.
Record control number 444676
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Dewey Decimal Classification
Koha item type Article
Suppress in OPAC No
Holdings
Date last seen Total Checkouts Price effective from Koha item type Lost status Source of classification or shelving scheme Damaged status Not for loan Collection code Withdrawn status Home library Current library Date acquired
05/20/2020   05/20/2020 Article Not Lost Dewey Decimal Classification     Reprints Collection   CIMMYT Knowledge Center: John Woolston Library CIMMYT Knowledge Center: John Woolston Library 05/20/2020

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