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Screening early maturing wheat for spot blotch resistance using area under progress curve

Duveiller, E.

Screening early maturing wheat for spot blotch resistance using area under progress curve - Birmingham (United Kingdom) British Society of Plant Pathology : 1998 - Printed

English

Subjects--Topical Terms:
Bipolaris
Crop losses
Disease resistance
Humid zones
Plant diseases
Plant response
Research projects
Selection
Spots
Subtropical zones
Wheat

Subjects--Index Terms: CIMMYT

Dewey Class. No.: 632.3 / INT No. 7

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Knowledge Center Catalog

Screening early maturing wheat for spot blotch resistance using area under progress curve

International Maize and Wheat Improvement Center (CIMMYT) © Copyright 2021.
Carretera México-Veracruz. Km. 45, El Batán, Texcoco, México, C.P. 56237.
If you have any question, please contact us at
CIMMYT-Knowledge-Center@cgiar.org

Knowledge Center Catalog

Screening early maturing wheat for spot blotch resistance using area under progress curve

International Maize and Wheat Improvement Center (CIMMYT) © Copyright 2021. Carretera México-Veracruz. Km. 45, El Batán, Texcoco, México, C.P. 56237. If you have any question, please contact us at CIMMYT-Knowledge-Center@cgiar.org

International Maize and Wheat Improvement Center (CIMMYT) © Copyright 2021.
Carretera México-Veracruz. Km. 45, El Batán, Texcoco, México, C.P. 56237.
If you have any question, please contact us at
CIMMYT-Knowledge-Center@cgiar.org