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Spectral reflectance indices as a selection criterion for yield improvement in wheat

Babar, M.A.

Spectral reflectance indices as a selection criterion for yield improvement in wheat - Oklahoma, OK (USA) : Oklahoma State University, 2005 - xvi, 148 pages - Printed|Computer File

Nationality: BD Thesis (Ph. D.)

English

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Knowledge Center Catalog

Spectral reflectance indices as a selection criterion for yield improvement in wheat

International Maize and Wheat Improvement Center (CIMMYT) © Copyright 2021.
Carretera México-Veracruz. Km. 45, El Batán, Texcoco, México, C.P. 56237.
If you have any question, please contact us at
CIMMYT-Knowledge-Center@cgiar.org

Knowledge Center Catalog

Spectral reflectance indices as a selection criterion for yield improvement in wheat

International Maize and Wheat Improvement Center (CIMMYT) © Copyright 2021. Carretera México-Veracruz. Km. 45, El Batán, Texcoco, México, C.P. 56237. If you have any question, please contact us at CIMMYT-Knowledge-Center@cgiar.org

International Maize and Wheat Improvement Center (CIMMYT) © Copyright 2021.
Carretera México-Veracruz. Km. 45, El Batán, Texcoco, México, C.P. 56237.
If you have any question, please contact us at
CIMMYT-Knowledge-Center@cgiar.org