The accuracy of eight wheat simulation models was compared for mean simulated yield. The error of prediction generally increased with mean yield. This suggests that, for models designed to simulate yield in low-potential environments, the published errors determined in high-potential environments are not directly applicable for lower yielding environments. Underestimation of wheat yield under stressed conditions was a common problem for many models. Such shortcomings need to be addressed before the models can be expected to exhibit low errors that are commensurate with the low yields. Indeed, new models may need to be derived for accurate simulation at very low yields involving isolated plants

English

0010|AGRIS 0101|AL-Wheat Program

Jose Juan Caballero

CIMMYT Publications Collection